IEEE Military Communications Conference
28 October – 1 November 2024 // Washington, DC, USA
C5I Technologies for Military and Intelligence Operations Today and Tomorrow

Manuscript Requirements


All submissions should be written in English with draft papers up to six (6) printed pages in length, two-column, single-spaced with 10-point font on US Letter paper. Final papers that exceed six (6) pages will be assessed a per-page over-length charge of $150/page, up to a maximum of eight (8) total pages.

Standard IEEE templates for Microsoft Word and formats can be found at:

EDAS requires a 200 – 500 word abstract to get underway. Please use your draft paper’s abstract.

A draft paper must be submitted for consideration prior to the final closing dates on the conference website.

The papers follow IEEE policy and will have at least three qualified blind reviewers and will be judged against other submitted papers for applicability, etc.


To be published in the IEEE MILCOM 2024 Conference Proceedings and to be eligible for publication in IEEE Xplore®, an author of an accepted paper is required to register for the conference at a full conference rate and the paper must be presented by an author of that paper at the conference. For authors with multiple accepted papers, one full registration is valid for up to 3 papers.

Non-refundable registration fees must be paid prior to uploading the final IEEE formatted, publication-ready version of the paper.

Accepted and presented papers will be published in the IEEE MILCOM 2024 Conference Proceedings and submitted to IEEE Xplore® as well as other Abstracting and Indexing (A&I) databases.

For final manuscript preparation, papers must first be made compatible with IEEE Xplore using PDF express. The conference ID for MILCOM24 is 61039X.


Papers are reviewed on the basis that they do not contain plagiarized material and have not been submitted to any other conference at the same time (double submission). These matters are taken very seriously, and IEEE will take action against any author who has engaged in either practice.

IEEE Web Page on Plagiarism

IEEE Web Page on Double Submission